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BL17 SHARAKU Polarized Neutron Reflectometer


Investigation of microscopic structures of interfaces using microscopic neutron spins

Research ObjectivesRevealing mechanisms of functions of thin film devices by studying structures of surface and buried interfaces.
FeaturesEnhanced sensitivity of magnetic moments using polarized neutrons, and a high-precision neutron reflectivity measurement of a wide variety of thin films such as magnetic devices, nonmagnetic films, metallic films, polymer films, regardless of materials.


Last Update: 2016-12-19

InstrumentPolarized Neutron Reflectometer (SHARAKU)
Overview of instrumentRevealing mechanism of function of thin film materials by analyzing structures of their surface and buried interfaces.
Moderator typeCoupled moderator
Neutron wavelength0.24-0.88 nm (polarized neutron)
0.11-0.88 nm (unpolarized neutron)
Scattering angle2θ=0-18°
qmaxqmax=8.19 nm-1 (polarized neutron)
qmax=17.9 nm-1 (unpolarized neutron)
Instrument sizeDistance between neutron source and sample:15.5 m
Distance between sample and detector:2.5 m
Detector3He gas tubes (1/2")
3He gas area detector (discussion needed)
Other information for user's convenienceN/A

Beamline Team

ContactKazuhiko SOYAMA (J-PARC Center, JAEA)
Secondary contactHiroyuki AOKI (J-PARC Center, JAEA)
Jun-ichi SUZUKI (Neutron Science and Technology Center, CROSS)
Noboru MIYATA (Neutron Science and Technology Center, CROSS)
Kazuhiro AKUTSU (Neutron Science and Technology Center, CROSS)
Takayasu HANASHIMA (Neutron Science and Technology Center, CROSS)
Satoshi KASAI (Neutron Science and Technology Center, CROSS)

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